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SFT9200 Coating Thickness Gauge

From:   Author:   Date:2011-11-07  

SFT9200 Series, Fluorescent X-ray (XRF) Coating Thickness Gauge

 

[Main Features of SFT9200]
1. Successor to the SFT 3000 series
2. Film Analysis FP software enables highly precise measurement of coating thickness even with contoured samples .
3. Collision prevention sensor makes contoured samples safe to use
4. Easy focus operation with the laser focus mechanism
5. Easy to observe microscopic areas, equipped with four-step zoom (option)
6. Focus distance toggle mechanism enables measurement of low area in a sample with height
7. Incident lighting makes samples easier to view

 

[Specifications]

Type SFT9250 SFT9255
Elements Atomic No. 22(Ti) to 83(Bi)
Atomic No. 21 or less can be measured by the absorption method
X-ray source Small Air-cooled X-ray tube (Be window)
Voltage: 45kV
Current: 1mA
Detector Proportional Counter
Collimator Round: 0.1, 0.2, 0.3mm
Rectangular: 0.2 x 0.05, 0.05 x 0.2mm
Options: Round 25, 50µm Rectangular 25 x 200µm
Sample Observation CCD camera
Sample image focus Laser Pointer
Filter Primary filter: Al, automatic switching
Secondary filter: Co, automatic switching

      (Stage size )

Sample

Stage

         (Traveling )

640(W) x 810D) x 900(H)mm X:220mm, Y:150mm, Z:150mm 930(W) x 860D) x 900(H)mm X:400mm, Y:300mm, Z:50mm 680(W) x 810D) x 900(H)mm X:700mm, Y:600mm, Z:15mm
Controller Desktop Computer with 19 inch LCD monitor
Application Software Thin Film FP (All types of thin films: Max 5 layers,10 elements per layer), Calibration
Data Process Microsoft® Excel, Microsoft® Word
Safety Functions: Sample door interlock, Crash protection function

 Options:
 
• Coating solution analysis (Bulk Calibration)
• Bulk FP method (Material component analysis)
• Spectrum matching software (Material ID)
• Mapping (Intensity surface analysis multi point display) software

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